Radiation effects and soft errors in integrated circuits and electronic devices  [electronic resource] / 
editors, R.D. Schrimpf, D.M. Fleetwood. 
 - Singapore ;  New Jersey :  World Scientific Pub.,  c2004. 
 - viii, 339 p. :  ill. 
 - Selected topics in electronics and systems ;  vol. 34 .
 - Selected topics in electronics and systems ;  vol. 34. .
<br/><br/> Also published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623. 
<br/><br/>Includes bibliographical references. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic circuits--Effect of radiation on.<br/>Integrated circuits--Effect of radiation on.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7870.285  / .R33 2004eb