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1.
Photographic sensitivity [electronic resource] : theory and mechanisms / Tadaaki Tani. by Series: Oxford series in optical and imaging sciences
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: Oxford ; New York : Oxford University Press, 1995
Availability: No items available.

2.
Scanning force microscopy [electronic resource] : with applications to electric, magnetic, and atomic forces / Dror Sarid. by Series: Oxford series in optical and imaging sciences ; 5.
Edition: Rev. ed.
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1994
Availability: No items available.

3.
Introduction to scanning tunneling microscopy [electronic resource] / C. Julian Chen. by Series: Oxford series in optical and imaging sciences ; 4.
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1993
Availability: No items available.

4.
Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. by Series: Oxford series in optical and imaging sciences ; 9.
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1995
Availability: No items available.