Mechanical stress on the nanoscale [electronic resource] : simulation, material systems and characterization techniques / edited by Margrit Hanbücken, Pierre Müller, and Ralf B. Wehrspohn.

Contributor(s): Material type: TextTextPublication details: Weinheim, Germany : Wiley-VCH, 2011.Description: xxi, 358 p. : ill. (some col.)Subject(s): Genre/Form: LOC classification:
  • QC176.8.N35 M43 2011eb
Online resources:
Contents:
pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.
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Includes bibliographical references and index.

pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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