Atomic force microscopy [electronic resource] : exploring basic modes and advanced applications / Greg Haugstad.

By: Contributor(s): Material type: TextTextPublication details: Hoboken, N.J. : John Wiley & Sons, c2012.Description: xxii, 464 p. : illSubject(s): Genre/Form: DDC classification:
  • 620/.5 23
LOC classification:
  • QH212.A78 H38 2012eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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