Applied Rasch Measurement: A Book of Exemplars [electronic resource] : Papers in Honour of John P. Keeves / edited by Rupert Maclean, Ryo Watanabe, Robyn Baker, Boediono, Yin Cheong Cheng, Wendy Duncan, John Keeves, Zhou Mansheng, Colin Power, J. S. Rajput, Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi.

By: Contributor(s): Material type: TextTextSeries: Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4 | Education in the Asia-Pacific Region: Issues, Concerns and Prospects ; 4Publication details: Dordrecht : Springer Netherlands, 2005.Description: digitalISBN:
  • 9781402030765
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 370 23
LOC classification:
  • L1-991
Online resources: In: Springer eBooks
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