Semiconductor strain metrology [electronic resource] : principles and applications / Terence K.S. Wong.

By: Contributor(s): Material type: TextTextPublication details: [Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]Description: 136 p. : illSubject(s): Genre/Form: LOC classification:
  • TK7871.85 .W65 2012eb
Online resources:
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

There are no comments on this title.

to post a comment.