Scanning probe microscopy for industrial applications : nanomechanical characterization / edited by Dalia G. Yablon.

Contributor(s): Material type: TextTextPublisher: Hoboken, New Jersey : Wiley, 2014Copyright date: ©2014Description: 1 online resource (385 pages) : illustrations (some color), graphsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781118723142 (e-book)
Subject(s): Genre/Form: Additional physical formats: Print version:: Scanning probe microscopy for industrial applications : nanomechanical characterization.DDC classification:
  • 620.1/127 23
LOC classification:
  • TA417.23 .S336 2014eb
Online resources:
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Includes bibliographical references at the end of each chapters and index.

Description based on print version record.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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