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1.
High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Series: Frontiers in electronic testing
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: Boston : Kluwer Academic, c2003
Availability: No items available.

2.
Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] / Takashi Nakamura ... [et al.]. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: Hackensack, NJ : World Scientific, c2008
Availability: No items available.

3.
Vertical 3D memory technologies / Betty Prince. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: Chichester, England : Wiley, 2014Copyright date: ©2014
Availability: No items available.