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	1.	Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit ebrary, Inc Series: Frontiers in electronic testing Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic, c2000 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	2.	A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E ebrary, Inc Series: Frontiers in electronic testing Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2002 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	3.	Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	4.	High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Adams, R. Dean ebrary, Inc Series: Frontiers in electronic testing Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	5.	Boundary-scan interconnect diagnosis [electronic resource] / José T. de Sousa, Peter Y.K. Cheung. by Sousa, José T. de Cheung, Peter Y. K ebrary, Inc Series: Frontiers in electronic testing ; 18. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2001 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	6.	Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo Prinetto, Paolo ebrary, Inc Series: Frontiers in electronic testing ; 23. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	7.	Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna Zilic, Zeljko ebrary, Inc Series: Frontiers in electronic testing ; 25. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)