Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

By: Contributor(s): Material type: TextTextPublisher: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014Copyright date: ©2014Description: 1 online resource (345 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783527681082 (e-book)
Subject(s): Genre/Form: Additional physical formats: Print version:: Fringe pattern analysis for optical metrology : theory, algorithms, and applications.DDC classification:
  • 621.36 23
LOC classification:
  • QC415 .S478 2014eb
Online resources:
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Includes bibliographical references and index.

Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).

Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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