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1.
Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. by Series: Oxford series in optical and imaging sciences ; 9.
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: New York : Oxford University Press, 1995
Availability: No items available.

2.
Nanobeam x-ray scattering : probing matter at the nanoscale / Julian Stangl [and three others]. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: Hoboken, New Jersey : John Wiley & sons, 2013
Availability: No items available.