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Boundary-scan interconnect diagnosis [electronic resource] / José T. de Sousa, Peter Y.K. Cheung. by Series: Frontiers in electronic testing ; 18.
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: Boston : Kluwer Academic Publishers, c2001
Availability: No items available.

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Semiconductor packaging [electronic resource] : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo. by
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Boca Raton : CRC Press, 2011
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