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	1.	Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. by Joy, David C, 1943- ebrary, Inc Series: Oxford series in optical and imaging sciences ; 9. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publication details: New York : Oxford University Press, 1995 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	2.	Nanobeam x-ray scattering : probing matter at the nanoscale / Julian Stangl [and three others]. by Stangl, Julian Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Hoboken, New Jersey : John Wiley & sons, 2013 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)
	3.	Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films / John Wolstenholme. by Wolstenholme, John [author.] Series: Materials characterization and analysis collection Material type: Text; Format: available online ; Literary form: Not fiction ; Audience: Specialized; Publisher: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015 Online resources: An electronic book accessible through the World Wide Web; click to view Availability: No items available. Save to lists Add to cart (remove)