000 01473nam a2200373Ia 4500
001 0000115802
005 20171002060127.0
006 m u
007 cr cn|||||||||
008 940915s1995 nyua sb 000 0 eng d
010 _z 94035642
020 _z0195088743 (acid-free paper)
020 _z9780195088748
035 _a(CaPaEBR)ebr10358552
035 _a(OCoLC)435816746
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aQH212.E4
_bJ67 1995eb
082 0 4 _a502/.8/25
_220
100 1 _aJoy, David C.,
_d1943-
245 1 0 _aMonte Carlo modeling for electron microscopy and microanalysis
_h[electronic resource] /
_cDavid C. Joy.
260 _aNew York :
_bOxford University Press,
_c1995.
300 _aviii, 216 p. :
_bill.
490 1 _aOxford series in optical and imaging sciences ;
_v9
504 _aIncludes bibliographical references.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2011.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aElectron microscopy
_xComputer simulation.
650 0 _aElectron probe microanalysis
_xComputer simulation.
650 0 _aMonte Carlo method.
655 7 _aElectronic books.
_2local
710 2 _aebrary, Inc.
830 0 _aOxford series in optical and imaging sciences ;
_v9.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10358552
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c104952
_d104952