000 | 01473nam a2200373Ia 4500 | ||
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001 | 0000115802 | ||
005 | 20171002060127.0 | ||
006 | m u | ||
007 | cr cn||||||||| | ||
008 | 940915s1995 nyua sb 000 0 eng d | ||
010 | _z 94035642 | ||
020 | _z0195088743 (acid-free paper) | ||
020 | _z9780195088748 | ||
035 | _a(CaPaEBR)ebr10358552 | ||
035 | _a(OCoLC)435816746 | ||
040 |
_aCaPaEBR _cCaPaEBR |
||
050 | 1 | 4 |
_aQH212.E4 _bJ67 1995eb |
082 | 0 | 4 |
_a502/.8/25 _220 |
100 | 1 |
_aJoy, David C., _d1943- |
|
245 | 1 | 0 |
_aMonte Carlo modeling for electron microscopy and microanalysis _h[electronic resource] / _cDavid C. Joy. |
260 |
_aNew York : _bOxford University Press, _c1995. |
||
300 |
_aviii, 216 p. : _bill. |
||
490 | 1 |
_aOxford series in optical and imaging sciences ; _v9 |
|
504 | _aIncludes bibliographical references. | ||
533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
650 | 0 |
_aElectron microscopy _xComputer simulation. |
|
650 | 0 |
_aElectron probe microanalysis _xComputer simulation. |
|
650 | 0 | _aMonte Carlo method. | |
655 | 7 |
_aElectronic books. _2local |
|
710 | 2 | _aebrary, Inc. | |
830 | 0 |
_aOxford series in optical and imaging sciences ; _v9. |
|
856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10358552 _zAn electronic book accessible through the World Wide Web; click to view |
908 | _a170314 | ||
942 | 0 | 0 | _cEB |
999 |
_c104952 _d104952 |