000			01556nam a2200349 a 4500
001			0000123913
005			20171002060627.0
006			m u
007			cr cn|||||||||
008			100115s2010 dcud s 001 0 eng d
010			_z 2010920778
020			_z9781607504900 (hardcover)
020			_z9781607504917 (e-book)
035			_a(CaPaEBR)ebr10403973
035			_a(OCoLC)680616682
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aQC173.4.I57 _bR47 2010eb
111	2		_aResearch Symposium on Characterization and Behavior of Interfaces _d(21 September 2008 : _cAtlanta, Ga.)
245	1	0	_aCharacterization and behavior of interfaces _h[electronic resource] : _bproceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA / _c[edited by] J. David Frost.
260			_aWashington, D.C. : _bIOS Press, _c2010.
300			_ax, 155 p. : _bill.
500			_aIncludes index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2010. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aInterfaces (Physical sciences)
650		0	_aShear flow.
655		7	_aElectronic books. _2local
700	1		_aFrost, J. David.
710	2		_aGeorgia Institute of Technology. _bSchool of Civil and Environmental Engineering (Atlanta, Ga., U.S.A.)
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10403973 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c113062 _d113062