000			01371nam a2200361Ia 4500
001			0000125171
005			20171002060716.0
006			m u
007			cr cn|||||||||
008			100617s2010 enka sb 001 0 eng d
010			_z 2010024537
020			_z9780470747483
035			_a(CaPaEBR)ebr10412605
035			_a(OCoLC)669861875
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aHD61 _b.O66 2010eb
082	0	4	_a658.15/5 _222
245	0	0	_aOperational risk management _h[electronic resource] : _ba practical approach to intelligent data analysis / _cedited by Ron S. Kenett, Yossi Raanan.
260			_aChichester ; _a[Hoboken] : _bJohn Wiley & Sons, _c2010.
300			_axxxvii, 285 p. : _bill.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2010. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aRisk management.
650		0	_aQuality control.
650		0	_aInformation technology _xQuality control.
650		0	_aProcess control.
655		7	_aElectronic books. _2local
700	1		_aKenett, Ron.
700	1		_aRaanan, Yossi.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10412605 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c114320 _d114320