| 000 | 01476nam a2200373Ia 4500 | ||
|---|---|---|---|
| 001 | 0000125201 | ||
| 005 | 20171002060717.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 091005s2010 maua sb 001 0 eng d | ||
| 020 | _z9781596939899 | ||
| 020 | _z1596939893 | ||
| 035 | _a(CaPaEBR)ebr10412729 | ||
| 035 | _a(OCoLC)672293639 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTK7874 _b.B35 2010eb |
| 082 | 0 | 4 |
_a621.38132 _222 |
| 100 | 1 | _aBahukudumbi, Sudarshan. | |
| 245 | 1 | 0 |
_aWafer-level testing and test during burn-in for integrated circuits _h[electronic resource] / _cSudarshan Bahukudumbi, Krishnendu Chakrabarty. |
| 260 |
_aBoston : _bArtech House, _c2010. |
||
| 300 |
_axv, 198 p. : _bill. |
||
| 490 | 1 | _aArtech House integrated microsystems series | |
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aIntegrated circuits _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xWafer-scale integration. |
|
| 650 | 0 |
_aSemiconductors _xTesting. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 700 | 1 | _aChakrabarty, Krishnendu. | |
| 710 | 2 | _aebrary, Inc. | |
| 830 | 0 | _aArtech House integrated microsystems series. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10412729 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c114350 _d114350 |
||