000 01338nam a2200349 a 4500
001 0000126673
005 20171002060808.0
006 m u
007 cr cn|||||||||
008 100416s2010 si a sb 000 0 eng d
010 _z 2010278394
020 _z9789814277433
020 _z9814277436
035 _a(CaPaEBR)ebr10422353
035 _a(OCoLC)630166345
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTA169
_b.S765 2010eb
082 0 4 _a620/.00452
_222
245 0 0 _aStochastic reliability modeling, optimization and applications
_h[electronic resource] /
_ceditors, Syouji Nakamura, Toshio Nakagawa.
260 _aSingapore ;
_aHackensack, NJ :
_bWorld Scientific,
_cc2010.
300 _axvi, 300 p. :
_bill.
504 _aIncludes bibliographical references.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aReliability (Engineering)
_xMathematical models.
650 0 _aStochastic systems.
655 7 _aElectronic books.
_2local
700 1 _aNakamura, Syouji.
700 1 _aNakagawa, Toshio,
_d1942-
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10422353
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c115822
_d115822