| 000 | 01189nam a2200313 a 4500 | ||
|---|---|---|---|
| 001 | 0000136107 | ||
| 005 | 20171002061358.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 110712s2010 njuad sb 001 0 eng d | ||
| 020 | _z981427710X | ||
| 020 | _z9789814277105 | ||
| 020 | _z9789814277112 (e-book) | ||
| 035 | _a(CaPaEBR)ebr10479993 | ||
| 035 | _a(OCoLC)701731809 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aQC611.8.C64 _bJ64 2010eb |
| 100 | 1 | _aJohnston, Allan. | |
| 245 | 1 | 0 |
_aReliability and radiation effects in compound semiconductors _h[electronic resource] / _cAllan Johnston. |
| 260 |
_aHackensack, N.J. : _bWorld Scientific, _c2010. |
||
| 300 |
_axii, 363 p. : _bill. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 | _aCompound semiconductors. | |
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aebrary, Inc. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10479993 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c125256 _d125256 |
||