| 000 | 01480nam a2200361 a 4500 | ||
|---|---|---|---|
| 001 | 0000136164 | ||
| 005 | 20171002061400.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 110308s2010 njuac sb 001 0 eng d | ||
| 010 | _z 2011280775 | ||
| 020 | _z9814273325 | ||
| 020 | _z9789814273329 | ||
| 020 | _z9789814273336 (e-book) | ||
| 035 | _a(CaPaEBR)ebr10480052 | ||
| 035 | _a(OCoLC)714877548 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTK7874.76 _b.T36 2010eb |
| 100 | 1 |
_aTan, Cher Ming, _d1959- |
|
| 245 | 1 | 0 |
_aElectromigration in ULSI interconnections _h[electronic resource] / _cCher Ming Tan. |
| 260 |
_aHackensack, N.J. : _bWorld Scientific, _cc2010. |
||
| 300 |
_axix, 291 p. : _bill. (some col.), col. port. |
||
| 490 | 1 | _aInternational series on advances in solid state electronics and technology (ASSET) | |
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aIntegrated circuits _xUltra large scale integration. |
|
| 650 | 0 | _aElectrodiffusion. | |
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aebrary, Inc. | |
| 830 | 0 | _aInternational series on advances in solid state electronics and technology. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10480052 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c125313 _d125313 |
||