000 01347nam a2200361 a 4500
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005 20171002062544.0
006 m u
007 cr cn|||||||||
008 090429s2012 njua sb 001 0 eng d
010 _z 2009017252
020 _z0470454652 (cloth)
020 _z9780470454657
020 _z9780470541593 (e-book)
035 _a(CaPaEBR)ebr10592157
035 _a(OCoLC)773301908
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTS173
_b.K63 2012eb
082 0 4 _a620/.00452
_222
100 1 _aKlyatis, Lev M.
245 1 0 _aAccelerated reliability and durability testing technology
_h[electronic resource] /
_cLev M. Klyatis.
260 _aHoboken, N.J. :
_bWiley,
_cc2012.
300 _axviii, 411 p. :
_bill.
440 0 _aWiley series in systems engineering and management
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2011.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aReliability (Engineering)
650 0 _aAccelerated life testing.
655 7 _aElectronic books.
_2local
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10592157
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c143664
_d143664