| 000 | 01278nam a2200337Ia 4500 | ||
|---|---|---|---|
| 001 | 0000157408 | ||
| 005 | 20171002062742.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 120302s2012 njua sb 001 0 eng d | ||
| 010 | _z 2012003429 | ||
| 020 | _z9780470638828 | ||
| 020 | _z9781118360699 (ebook) | ||
| 035 | _a(CaPaEBR)ebr10606048 | ||
| 035 | _a(OCoLC)810936286 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aQH212.A78 _bH38 2012eb |
| 082 | 0 | 4 |
_a620/.5 _223 |
| 100 | 1 |
_aHaugstad, Greg, _d1963- |
|
| 245 | 1 | 0 |
_aAtomic force microscopy _h[electronic resource] : _bexploring basic modes and advanced applications / _cGreg Haugstad. |
| 260 |
_aHoboken, N.J. : _bJohn Wiley & Sons, _cc2012. |
||
| 300 |
_axxii, 464 p. : _bill. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2011. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 | _aAtomic force microscopy. | |
| 650 | 0 | _aScanning proble microscopy. | |
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 | _aebrary, Inc. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10606048 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c146556 _d146556 |
||