000 01278nam a2200337Ia 4500
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005 20171002062742.0
006 m u
007 cr cn|||||||||
008 120302s2012 njua sb 001 0 eng d
010 _z 2012003429
020 _z9780470638828
020 _z9781118360699 (ebook)
035 _a(CaPaEBR)ebr10606048
035 _a(OCoLC)810936286
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aQH212.A78
_bH38 2012eb
082 0 4 _a620/.5
_223
100 1 _aHaugstad, Greg,
_d1963-
245 1 0 _aAtomic force microscopy
_h[electronic resource] :
_bexploring basic modes and advanced applications /
_cGreg Haugstad.
260 _aHoboken, N.J. :
_bJohn Wiley & Sons,
_cc2012.
300 _axxii, 464 p. :
_bill.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2011.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aAtomic force microscopy.
650 0 _aScanning proble microscopy.
655 7 _aElectronic books.
_2local
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10606048
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c146556
_d146556