000 01369nam a2200373Ia 4500
001 0000164468
005 20171002063215.0
006 m u
007 cr cn|||||||||
008 100408s2010 nyua sb 001 0 eng d
010 _z 2010012145
020 _z1616682515
020 _z9781611226874
020 _z9781616682514 (hc)
035 _a(CaPaEBR)ebr10661698
035 _a(OCoLC)839305357
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aQC589
_b.C48 2010eb
082 0 4 _a537/.2
_222
100 1 _aChubb, John.
245 1 3 _aAn introduction to electrostatic measurements
_h[electronic resource] /
_cJohn Chubb.
260 _aNew York :
_bNova Science Publishers,
_cc2010.
300 _axi, 216 p. :
_bill.
490 1 _aElectrical engineering developments
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aElectrostatics
_xMeasurement.
650 0 _aElectrostatic analyzers.
655 7 _aElectronic books.
_2local
710 2 _aebrary, Inc.
830 0 _aElectrical engineering developments series.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10661698
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c153614
_d153614