000			01705nam a2200409 a 4500
001			0000165429
005			20171002063247.0
006			m u
007			cr cn|||||||||
008			080909s2009 nyua sb 001 0 eng d
010			_z 2008039627
020			_z9781606922637 (softcover)
020			_z9781614701118 (e-book)
035			_a(CaPaEBR)ebr10670956
035			_a(OCoLC)759866034
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aTA169.6 _b.Y36 2009eb
082	0	4	_a620/.0044 _222
100	1		_aYang, O-Suk.
245	1	0	_aIntroduction of intelligent machine fault diagnosis and prognosis _h[electronic resource] / _cBo-Suk Yang and Achmad Widodo.
260			_aNew York : _bNova Science Publishers, _cc2009.
300			_aix, 351 p. : _bill.
504			_aIncludes bibliographical references and index.
505	0		_aData acquisition, processing, and analysis -- Feature extraction and clustering -- Feature selection -- Fault classification algorithms -- Decision fusion algorithms -- Fault prognosis algorithms.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aFault location (Engineering) _xAutomation.
650		0	_aAutomatic test equipment.
650		0	_aExpert systems (Computer science)
650		0	_aConscious automata.
650		0	_aMachine learning.
650		0	_aMachinery _xTesting.
655		7	_aElectronic books. _2local
700	1		_aWidodo, Achmad.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10670956 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c154575 _d154575