000			01283nam a2200337Ia 4500
001			0000168323
005			20171002063443.0
006			m u
007			cr cn|||||||||
008			130215s2013 nju sb 001 0 eng d
010			_z 2012045181
020			_z9780470886052 (hardback)
020			_z9781118589250
035			_a(CaPaEBR)ebr10687758
035			_a(OCoLC)841914445
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aQD96.S43 _bM34 2013eb
082	0	4	_a543/.65 _223
245	0	0	_aCluster secondary ion mass spectrometry _h[electronic resource] : _bprinciples and applications / _cedited by Christine M. Mahoney.
260			_aHoboken, N.J. : _bJohn Wiley & Sons, Inc., _c2013.
300			_a348 p.
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aSecondary ion mass spectrometry.
650		0	_aMass spectrometry.
655		7	_aElectronic books. _2local
700	1		_aMahoney, Christine M.
710	2		_aebrary, Inc.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10687758 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c157466 _d157466