| 000 | 01509nam a22003851i 4500 | ||
|---|---|---|---|
| 001 | 0000174311 | ||
| 005 | 20171002063844.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 131006s2013 enka ob 001 0 eng d | ||
| 020 | _a9783527655090 (ebook) | ||
| 020 | _z9783527410774 | ||
| 035 | _a(CaPaEBR)ebr10762543 | ||
| 035 | _a(OCoLC)858655510 | ||
| 040 |
_aCaPaEBR _beng _erda _epn _cCaPaEBR |
||
| 050 | 1 | 4 |
_aQC482.S3 _bS82 2014eb |
| 082 | 0 | 4 |
_a539.7222 _223 |
| 100 | 1 | _aStangl, Julian. | |
| 245 | 1 | 0 |
_aNanobeam x-ray scattering : _bprobing matter at the nanoscale / _cJulian Stangl [and three others]. |
| 264 | 1 |
_aHoboken, New Jersey : _bJohn Wiley & sons, _c2013. |
|
| 300 |
_a1 online resource (392 pages) : _billustrations |
||
| 336 |
_atext _2rdacontent |
||
| 337 |
_acomputer _2rdamedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 588 | _aDescription based on online resource; title from PDF title page (ebrary, viewed October 6, 2013). | ||
| 590 | _aElectronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | _aElectron probe microanalysis. | |
| 650 | 0 | _aNanotechnology. | |
| 650 | 0 |
_aX-rays _xScattering. |
|
| 655 | 0 | _aElectronic books. | |
| 797 | 2 | _aebrary. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10762543 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c163452 _d163452 |
||