| 000 | 01688nam a2200397 i 4500 | ||
|---|---|---|---|
| 001 | 0000179917 | ||
| 005 | 20171002064433.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 140205t20142014njuad ob 000 0 eng|d | ||
| 020 | _z9789814571937 | ||
| 020 | _a9789814571944 (e-book) | ||
| 035 | _a(CaPaEBR)ebr10832740 | ||
| 035 | _a(OCoLC)872678941 | ||
| 040 |
_aCaPaEBR _beng _erda _epn _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTA169 _b.R45 2014eb |
| 245 | 0 | 0 |
_aReliability modeling with applications : _bessays in honor of Professor Toshio Nakagawa on his 70th Birthday / _ceditors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan. |
| 264 | 1 |
_aNew Jersey : _bWorld Scientific, _c[2014] |
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| 264 | 4 | _c©2014 | |
| 300 |
_a1 online resource (379 pages) : _billustrations |
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| 336 |
_atext _2rdacontent |
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| 337 |
_acomputer _2rdamedia |
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| 338 |
_aonline resource _2rdacarrier |
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| 504 | _aIncludes bibliographical references. | ||
| 588 | _aDescription based on online resource; title from PDF title page (ebrary, viewed February 5, 2014). | ||
| 590 | _aElectronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | _aReliability (Engineering) | |
| 650 | 0 | _aStochastic systems. | |
| 655 | 0 | _aElectronic books. | |
| 700 | 1 | _aNakamura, Syouji. | |
| 700 | 1 | _aQian, Cun Hua. | |
| 700 | 1 | _aChen, Mingchih. | |
| 797 | 2 | _aebrary. | |
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10832740 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c169054 _d169054 |
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