000			02020nam a2200457 i 4500
001			0000184339
005			20171002064928.0
006			m o d
007			cr cn|||||||||
008			140620t20142014gw a ob 001 0 eng d
020			_z9783527411528
020			_a9783527681082 (e-book)
020			_z9783527681105 (ePub)
020			_z9783527681099 (Mobi)
020			_z9783527681075 (oBook)
035			_a(CaPaEBR)ebr10881255
035			_a(OCoLC)881028799
040			_aCaPaEBR _beng _erda _epn _cCaPaEBR
050	1	4	_aQC415 _b.S478 2014eb
082	0	4	_a621.36 _223
100	1		_aServín, Manuel, _eauthor.
245	1	0	_aFringe pattern analysis for optical metrology : _btheory, algorithms, and applications / _cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
264		1	_aWeinheim, Germany : _bWiley-VCH Verlag GmbH & Co. KGaA, _c2014.
264		4	_c©2014
300			_a1 online resource (345 pages) : _billustrations
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
504			_aIncludes bibliographical references and index.
588			_aDescription based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
590			_aElectronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650		0	_aDiffraction patterns _xData processing.
650		0	_aImage processing _xData processing.
655		0	_aElectronic books.
700	1		_aQuiroga, J. Antonio, _eauthor.
700	1		_aPadilla, J. Moises, _eauthor.
776	0	8	_iPrint version: _aServin, Manuel. _tFringe pattern analysis for optical metrology : theory, algorithms, and applications. _dWeinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 _hxvi, 327 pages _z9783527411528
797	2		_aebrary.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10881255 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c173474 _d173474