000			01756nam a2200421 i 4500
001			0000186496
005			20171002065151.0
006			m o d
007			cr cn|||||||||
008			140830t20042004wiua ob 001 0 eng d
020			_z9780873896207
035			_a(CaPaEBR)ebr10907751
035			_a(OCoLC)891386737
040			_aCaPaEBR _beng _erda _epn _cCaPaEBR
050	1	4	_aT50 _b.M423 2004eb
082	0	4	_a620/.0044 _222
245	0	4	_aThe metrology handbook / _cJay L. Bucher, editor ; acquisitions editor, Annemieke Hytinen ; project editor, Paul O'Mara.
264		1	_aMilwaukee, Wisconsin : _bASQ Quality Press, _c2004.
264		4	_c©2004
300			_a1 online resource (568 pages) : _billustrations
336			_atext _2rdacontent
337			_acomputer _2rdamedia
338			_aonline resource _2rdacarrier
504			_aIncludes bibliographical references and index.
588			_aDescription based on print version record.
590			_aElectronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
650		0	_aMeasurement _vHandbooks, manuals, etc.
650		0	_aCalibration _vHandbooks, manuals, etc.
650		0	_aQuality assurance _vHandbooks, manuals, etc.
655		0	_aElectronic books.
700	1		_aBucher, Jay L., _d1949- _eeditor.
700	1		_aHytinen, Annemieke, _eeditor.
700	1		_aO'Mara, Paul, _eeditor.
776	0	8	_iPrint version: _tMetrology handbook. _dMilwaukee, Wisconsin : ASQ Quality Press, c2004 _hxvi, 544 pages _z9780873896207 _w2004003464
797	2		_aebrary.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10907751 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c175630 _d175630