000 01329nam a2200337 a 4500
001 ebr10223883
003 CaPaEBR
006 m u
007 cr cn|||||||||
008 070911s2008 maua sb 001 0 eng
010 _z 2007037603
015 _aGBA847597
_2bnb
016 7 _z014566457
_2Uk
020 _z9780262026499 (hardcover : alk. paper)
020 _z026202649X (hardcover : alk. paper)
040 _aCaPaEBR
_cCaPaEBR
035 _a(OCoLC)228031090
050 1 4 _aQA76.76.V47
_bB35 2008eb
082 0 4 _a004.2/4
_222
100 1 _aBaier, Christel.
245 1 0 _aPrinciples of model checking
_h[electronic resource] /
_cChristel Baier, Joost-Pieter Katoen.
260 _aCambridge, Mass. :
_bMIT Press,
_c2008.
300 _axvii, 975 p. :
_bill.
504 _aIncludes bibliographical references (p. 931-964) and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aComputer systems
_xVerification.
650 0 _aComputer software
_xVerification.
655 7 _aElectronic books.
_2local
700 1 _aKatoen, Joost-Pieter.
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10223883
_zAn electronic book accessible through the World Wide Web; click to view
999 _c191015
_d191015