000 01928nam a2200397 i 4500
001 ebr11316799
003 MiAaPQ
006 m o d |
007 cr cn|||||||||
008 161219t20162016gw a ob 001 0 eng d
020 _z9783110477016
020 _z9783110480153 (PDF)
020 _z9783110479713 (EPUB)
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aTA417.3
_b.H836 2016eb
082 0 4 _a620.11278
_223
100 1 _aHuang, Songling,
_eauthor.
245 1 0 _aMagnetic flux leakage :
_btheories and imaging technologies /
_cSongling Huang, Wei Zhao.
264 1 _aBerlin, [Germany] ;
_aBoston, [Massachusetts] :
_bDe Gruyter,
_c2016.
264 4 _c�2016
300 _a1 online resource (242 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 1 _aAdvances in Electrical and Electronic Engineering,
_x2509-582X ;
_vVolume 1
504 _aIncludes bibliographical references and index.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed December 19, 2016).
590 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aMagnetic testing.
650 0 _aMagnetic flux.
655 4 _aElectronic books.
700 1 _aZhao, Wei,
_eauthor.
776 0 8 _iPrint version:
_aHuang, Songling.
_tMagnetic flux leakage : theories and imaging technologies.
_dBerlin, [Germany] ; Boston, [Massachusetts] : De Gruyter, c2016
_hix, 232 pages
_kAdvances in electrical and electronic engineering ; Volume 1.
_x2509-582X
_z9783110477016
797 2 _aProQuest (Firm)
830 0 _aAdvances in electrical and electronic engineering ;
_vVolume 1.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=11316799
_zAn electronic book accessible through the World Wide Web; click to view
999 _c198835
_d198835