000 01704nam a2200409 i 4500
001 EBC3328156
003 MiAaPQ
005 20250214125529.0
006 m o d |
007 cr cnu||||||||
008 141022t20142014sw a ob 000 0 eng d
020 _a9789175192130 (e-book)
035 _a(MiAaPQ)EBC3328156
035 _a(Au-PeEL)EBL3328156
035 _a(CaPaEBR)ebr10953561
035 _a(OCoLC)896833600
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aTK7871.15.S56
_b.Y393 2014
082 0 _a546.6832
_223
100 1 _aYazdanfar, Milan,
_eauthor.
245 1 0 _aPrecursors and defect control for halogenated CVD of thick SiC epitaxial layers /
_cMilan Yazdanfar.
264 1 _aLinkoping, Sweden :
_bLinkoping University,
_c2014.
264 4 _c2014
300 _a1 online resource (63 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 1 _aLinkoping Studies in Science and Technology Dissertations,
_x0345-7524 ;
_vNumber 1625
504 _aIncludes bibliographical references.
588 _aDescription based on online resource; title from PDF title page (ebrary, viewed October 22, 2014).
590 _aElectronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 _aSilicon carbide
_xResearch.
655 4 _aElectronic books.
797 2 _aProQuest (Firm)
830 0 _aLinkoping studies in science and technology.
_pDissertations ;
_vNumber 1625.
856 4 0 _uhttp://ebookcentral.proquest.com/lib/daystar-ebooks/detail.action?docID=3328156
_zClick to View
999 _c242600
_d242599