| 000 | 01502nam a2200373 a 4500 | ||
|---|---|---|---|
| 001 | 0000069749 | ||
| 005 | 20171002053435.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 980811s1998 nyua sb 001 0 eng | ||
| 010 | _z 98041250 | ||
| 020 | _z0306458969 | ||
| 035 | _a(CaPaEBR)ebr10046976 | ||
| 035 | _a(OCoLC)229449306 | ||
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTA418.7 _b.B43 1998eb |
| 082 | 0 | 4 |
_a620/.44 _221 |
| 245 | 0 | 0 |
_aBeam effects, surface topography, and depth profiling in surface analysis _h[electronic resource] / _cedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. |
| 260 |
_aNew York : _bPlenum Press, _cc1998. |
||
| 300 |
_axix, 430 p. : _bill. |
||
| 490 | 1 |
_aMethods of surface characterization ; _vv. 5 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
|
| 650 | 0 |
_aMaterials _xEffect of radiation on. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 700 | 1 |
_aCzanderna, Alvin Warren, _d1930- |
|
| 700 | 1 | _aMadey, Theodore E. | |
| 700 | 1 |
_aPowell, C. J. _q(Cedric John) |
|
| 710 | 2 | _aebrary, Inc. | |
| 830 | 0 |
_aMethods of surface characterization ; _vv. 5. |
|
| 856 | 4 | 0 |
_uhttp://site.ebrary.com/lib/daystar/Doc?id=10046976 _zAn electronic book accessible through the World Wide Web; click to view |
| 908 | _a170314 | ||
| 942 | 0 | 0 | _cEB |
| 999 |
_c58907 _d58907 |
||