000 01502nam a2200373 a 4500
001 0000069749
005 20171002053435.0
006 m u
007 cr cn|||||||||
008 980811s1998 nyua sb 001 0 eng
010 _z 98041250
020 _z0306458969
035 _a(CaPaEBR)ebr10046976
035 _a(OCoLC)229449306
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTA418.7
_b.B43 1998eb
082 0 4 _a620/.44
_221
245 0 0 _aBeam effects, surface topography, and depth profiling in surface analysis
_h[electronic resource] /
_cedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
260 _aNew York :
_bPlenum Press,
_cc1998.
300 _axix, 430 p. :
_bill.
490 1 _aMethods of surface characterization ;
_vv. 5
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aSurfaces (Technology)
_xAnalysis.
650 0 _aMaterials
_xEffect of radiation on.
655 7 _aElectronic books.
_2local
700 1 _aCzanderna, Alvin Warren,
_d1930-
700 1 _aMadey, Theodore E.
700 1 _aPowell, C. J.
_q(Cedric John)
710 2 _aebrary, Inc.
830 0 _aMethods of surface characterization ;
_vv. 5.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10046976
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c58907
_d58907