000			01501nam a22003854a 4500
001			0000075543
005			20171002053750.0
006			m u
007			cr cn|||||||||
008			010202s2001 maua sb 001 0 eng
010			_z 2001023211
020			_z0792373146 (hardcover : alk. paper)
035			_a(CaPaEBR)ebr10067374
035			_a(OCoLC)614723684
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aTK7870.23 _b.S64 2001eb
082	0	4	_a621.381 _221
100	1		_aSousa, José T. de.
245	1	0	_aBoundary-scan interconnect diagnosis _h[electronic resource] / _cJosé T. de Sousa, Peter Y.K. Cheung.
260			_aBoston : _bKluwer Academic Publishers, _cc2001.
300			_axxi, 168 p. : _bill.
490	1		_aFrontiers in electronic testing ; _v18
504			_aIncludes bibliographical references (p. 145-150) and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2013. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aBoundary scan testing.
650		0	_aElectronic apparatus and appliances _xTesting.
650		0	_aElectronic packaging.
650		0	_aElectric contacts _xTesting.
655		7	_aElectronic books. _2local
700	1		_aCheung, Peter Y. K.
710	2		_aebrary, Inc.
830		0	_aFrontiers in electronic testing ; _v18.
856	4	0	_uhttp://site.ebrary.com/lib/daystar/Doc?id=10067374 _zAn electronic book accessible through the World Wide Web; click to view
908			_a170314
942	0	0	_cEB
999			_c64701 _d64701