000 01293nam a2200361 a 4500
001 0000082655
005 20171002054141.0
006 m u
007 cr cn|||||||||
008 040519s2004 enka sb 001 0 eng d
010 _z 2004274185
015 _aGBA4-32318
016 7 _z0470844922
_2Uk
020 _z0470844922
035 _a(CaPaEBR)ebr10113965
035 _a(OCoLC)56732922
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTK7876
_b.M255 2004eb
082 0 4 _a621.3813
_221
082 0 4 _a621.381/3
_222
245 0 0 _aMicrowave electronics
_h[electronic resource] :
_bmeasurement and materials characterisation /
_cL. F. Chen ... [et al.].
260 _aChichester :
_bJohn Wiley,
_cc2004.
300 _axiii, 537 p. :
_bill.
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2013.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aMicrowave devices.
650 0 _aShortwave radio.
655 7 _aElectronic books.
_2local
700 1 _aChen, Linfeng.
710 2 _aebrary, Inc.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10113965
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c71813
_d71813