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001 0000096417
005 20171002054950.0
006 m u
007 cr cn|||||||||
008 061011s2006 njua sb 101 0 eng d
010 _z 2006284187
020 _z9789812566744
020 _z9812566740
035 _a(CaPaEBR)ebr10201469
035 _a(OCoLC)299584837
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aQA465
_b.A273 2006eb
245 0 0 _aAdvanced mathematical & computational tools in metrology VII
_h[electronic resource] /
_ceditors, P. Ciarlini ... [et al.].
246 3 _aAdvanced mathematical and computational tools in metrology VII
260 _aNew Jersey :
_bWorld Scientific,
_cc2006.
300 _axi, 363 p. :
_bill.
490 1 _aSeries on advances in mathematics for applied sciences ;
_vv. 72
504 _aIncludes bibliographical references and index.
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2009.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aMeasurement
_vCongresses.
650 0 _aPhysical measurements
_vCongresses.
655 7 _aElectronic books.
_2local
700 1 _aCiarlini, P.
710 2 _aebrary, Inc.
830 0 _aSeries on advances in mathematics for applied sciences ;
_vv. 72.
856 4 0 _uhttp://site.ebrary.com/lib/daystar/Doc?id=10201469
_zAn electronic book accessible through the World Wide Web; click to view
908 _a170314
942 0 0 _cEB
999 _c85571
_d85571