Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy.

By: Contributor(s): Material type: TextTextSeries: Oxford series in optical and imaging sciences ; 9.Publication details: New York : Oxford University Press, 1995.Description: viii, 216 p. : illSubject(s): Genre/Form: DDC classification:
  • 502/.8/25 20
LOC classification:
  • QH212.E4 J67 1995eb
Online resources:
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Includes bibliographical references.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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