Microelectronics failure analysis (Record no. 135989)

MARC details
000 -LEADER
fixed length control field 02041nam a2200409 a 4500
001 - CONTROL NUMBER
control field 0000146840
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20171002062046.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m u
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn|||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120128s2011 ohua sbf 001 0 eng d
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
Canceled/invalid LC control number 2012359075
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 161503725X
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781615037254
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781615037261 (e-book)
035 ## - SYSTEM CONTROL NUMBER
System control number (CaPaEBR)ebr10540838
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)771901447
040 ## - CATALOGING SOURCE
Original cataloging agency CaPaEBR
Transcribing agency CaPaEBR
050 14 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7871
Item number .M52 2011eb
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.381
Edition number 23
245 00 - TITLE STATEMENT
Title Microelectronics failure analysis
Medium [electronic resource] :
Remainder of title desk reference /
Statement of responsibility, etc. edited by Richard J. Ross.
250 ## - EDITION STATEMENT
Edition statement 6th ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Materials Park, Ohio :
Name of publisher, distributor, etc. ASM International,
Date of publication, distribution, etc. c2011.
300 ## - PHYSICAL DESCRIPTION
Extent xi, 660 p. :
Other physical details ill.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and indexes.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
533 ## - REPRODUCTION NOTE
Type of reproduction Electronic reproduction.
Place of reproduction Palo Alto, Calif. :
Agency responsible for reproduction ebrary,
Date of reproduction 2011.
Note about reproduction Available via World Wide Web.
-- Access may be limited to ebrary affiliated libraries.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electronics
General subdivision Materials
-- Testing
Form subdivision Handbooks, manuals, etc.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
General subdivision Materials
-- Testing
Form subdivision Handbooks, manuals, etc.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Microelectronics
General subdivision Materials
-- Defects
Form subdivision Handbooks, manuals, etc.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electronic apparatus and appliances
General subdivision Testing
Form subdivision Handbooks, manuals, etc.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Semiconductors
General subdivision Defects
Form subdivision Handbooks, manuals, etc.
655 #7 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
Source of term local
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ross, Richard J.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element ebrary, Inc.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://site.ebrary.com/lib/daystar/Doc?id=10540838">http://site.ebrary.com/lib/daystar/Doc?id=10540838</a>
Public note An electronic book accessible through the World Wide Web; click to view
908 ## - PUT COMMAND PARAMETER (RLIN)
Put command parameter 170314
942 00 - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Electronic Book

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