ISTFA 2004 [electronic resource] : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASTM International.

By: Contributor(s): Material type: TextTextPublication details: Materials Park, OH : ASM International, c2004.Description: [717] p. : illSubject(s): Genre/Form: LOC classification:
  • TK7871 .I68 2004eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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