ISTFA 2010 [electronic resource] : conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2010, ASM International.

By: Contributor(s): Material type: TextTextPublication details: Materials Park, Ohio : ASM International, 2010.Description: xix, 464 p. : ill. (some col.)Subject(s): Genre/Form: LOC classification:
  • TK7871 .I87 2010eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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