VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Contributor(s): Material type: TextTextSeries: Morgan Kaufmann series in systems on siliconPublication details: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.Description: xxx, 777 p. : ill. ; 25 cmSubject(s): Genre/Form: DDC classification:
  • 621.39/5 22
LOC classification:
  • TK7874.75 .V587 2006eb
Online resources:
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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