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ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by
Material type: Text; Format:
electronic
available online
; Literary form:
Not fiction
Publication details: Materials Park, OH : ASM International, c2007
Other title:
- Proceedings of the 33rd International Symposium for Testing and Failure Analysis
- 33rd International Symposium for Testing and Failure Analysis
- Thirty-third International Symposium for Testing and Failure Analysis
Availability: No items available.
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