Reliability and radiation effects in compound semiconductors [electronic resource] / Allan Johnston.

By: Contributor(s): Material type: TextTextPublication details: Hackensack, N.J. : World Scientific, 2010.Description: xii, 363 p. : illSubject(s): Genre/Form: LOC classification:
  • QC611.8.C64 J64 2010eb
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Includes bibliographical references and index.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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